Articles

This page contains formal documentation and published works on SIMION. See also Links for less formal resources on the web.

General Documentation, Product Literature, Courses

• Frequently Asked Questions (FAQ)
• SIMION Brochure (6-page PDF)
• A Tour of the SIMION 7.0 Demo
• SIMION User Manual
• SIMION Course Notes (from ASMS)
• Introduction to Inorganic Isotope Ratio Mass Spectrometry - online course notes and SIMION models (B. Olszweski, T. Appelhans, G. Hieftje, 2007)

HOW-TOs

• Importing a solenoid magnetic field into SIMION by multiple methods - 2005-06
• SL Tools Tutorial – Describing the import of CAD models into SIMION, plus other potential array manipulation capabilities of the new “patools.exe” program soon to be available in the new SL v. 1.1. - 2004
• Editing SIMION Text Files – Emacs and VIM configuration - 2004
• Manipulating SIMION Potential Arrays Programmatically - D. Manura, 2003
• Exporting Electrostatic and Magnetic Field Data from SIMION (and Importing it too) - D. Manura, 2004
• Using SIMION under Linux

See also SIMION Supplemental Documentation.

SIS Application Notes

• Simulation of a Unique Cylindrical Quadrupole Mass Analyzer Using SIMION 7.0 [86]
• Examination of Source Design in Electrospray-TOF Using SIMION 3D [74]
• A Revisitation of the Finkelstein Ion Source using SIMION 3D - Part II [70]
• Application of SIMION 6.0 to the Study of Finkelstein - Part I (EAS 97) [69]
• Experimental Results and SIMION 3D Modeling of the Effects of Grids in TOF Mass Spectrometry (ASMS 97) [59]
• SIMION 3D v6.0 Ion Optics Simulation Software (AVS 96) [53]
• Computer Modeling of Ion Optics in Time-of-Flight Mass Spectrometry Using SIMION 3D (EAS 96) [52]
• The Application of SIMION 6.0 to Problems in Time-of-Flight Mass Spectrometry (ASMS 96) [47]
• Delayed extraction and Laser Desorption: Time-lag Focusing and Beyond (ASMS 96) [46]
• Application of SIMION 6.0 to Filament Design for Mass Spectrometer Ionization Sources (ASMS 96) [45]

Published Papers, Articles, and Preprints

This list of articles and papers on SIMION is far from complete. If you find other references or wish to have an article you published included, please contact us. Published papers on SIMION may be referenced as follows:

‘’D. A. Dahl, “SIMION for the personal computer in reflection,” Int. J. Mass Spectrom. 200 (2000) 3. (source: Scientific Instrument Services, Inc., Ringoes, NJ, www.simion.com).’‘

• Note: Many additional papers, not in this list, may be found by searching “SIMION” at these sites: ScienceDirect, IOP Electronic Journals, Google Scholar, AIP, Wiley, Taylor&Francis, Springer, JAP, JVST, etc.
• Charged Particle Optics Theory and Simsulation course (Erasmus Intensive Program) http://cpots.physics.uoc.gr/. Theo Zouros et al. Traditional theoretical CPO concepts are presented, explored, verified, and anlayzed with SIMION 8.1 labs in an intensive two-week course. September 2011, with planned repeats in 2012 and 2013 (available to certain universities in this Erasmus proposal).
• Daniel Gershman, Thomas Zurbuchen. Modeling extreme ultraviolet suppression of electrostatic analyzers. Rev. Sci. Instrum. 81, 045111 (2010); doi:10.1063/1.3378685 online - Novel use of SIMION to simulate surface scattering of extreeme ultraviolet photons (charge=0 particles), which reduce signal-to-noise in TOF instruments used in outer-space environments.
• A time-of-flight-Mott apparatus for soft x-ray spin resolved photoemission on solid samples L. Moreschini, G. Ghiringhelli, K. Larsson, U. Veit, and N. B. Brookes. Rev. Sci. Instrum. 79, 033905 (2008) – uses SIMION to determine TOF dimensions and voltages in TOF-Mott instrument.
• Aberration coefficients of multi-element cylindrical electrostatic lens systems for charged particle beam applications Omer Sise, Melike Ulua and Mevlut Dogana. Nucl. Instrum. Meth. A 573/3 (2007) 329-339
• Characterization and modeling of multi-element electrostatic lens systems Omer Sise, Melike Ulua and Mevlut Dogan. Rad. Phys. Chem. 76/3 (2007), 593-598
• Evaluation of aberrations of immersion objective lenses in relation to electron emission microscopy Bernheim M. Eur. Phys. J. Appl. Phys. 36, 193-204 (2006)
• Image acquisition with immersion objective lenses using electrons emitted with several tenths of an electron volt energies: Towards high spatial resolution ESCA analysis Bernheim M. Ultramicroscopy 106 (2006) 398-412
• Investigation of the accuracy of ion optics simulations using Kepler orbits in a spherical capacitor T.J.M. Zouros, Omer Sise, F.M. Spiegelhalder, and David J. Manura. International Journal of Mass Spectrometry. Volume 261, Issues 2-3, 15 March 2007, Pages 115-133.
• Application of electrospray mass-spectrometry for nanoparticle investigations: Simulation of ion movement in a supersonic jet Koltsov S., Walther C. Institute for Analytical Instrumentation, Russian Academy of Sciences, St. Petersburg, Russian Federation. 17th International Mass Spectrometry Conference, 2006 (poster)
• Multi-element electrostatic lens systems for focusing and controlling charged particles Omer Sise, Melike Ulu, and Mevlut Dogan. Afyon Kocatepe University, Afyon, Turkey. 2005. (preprint)
• Computer Simulation of Time-of-Flight Mass Spectrometers: Calculations of Mass Spectra and Spatial Distributions of Ions Veryovkin I.V., Chen Ch.-Y., Calaway W.F., Pellin M.J., Lee T. Nucl. Instr. and Meth. A, 2004, V. 519, 1-2, P. 345-352
• Virtual Reality Instrument: Near-Future Perspective of Computer Simulations of Ion Optics Veryovkin I.V., Calaway W.F., Pellin M.J. Nucl. Instr. and Meth. A, 2004, V. 519, 1-2, P. 363-372
• Ion Optics of a New Time-Of-Flight Mass Spectrometer For Quantitative Surface Analysis Veryovkin I.V., Calaway W.F., Pellin M.J. Nucl. Instr. and Meth. A, 2004 V. 519, 1-2, P. 353-362
• A new time-of-flight instrument for quantitative surface analysis Veryovkin I.V., Calaway W.F., Moore J.F., Pellin M.J., Burnett D.S. Nucl. Instr. and Meth. B, 2004, V. 219-220, P.473-479
• Thin organic films by atmospheric-pressure ion deposition Saf, R., Goriup, M., Steindl, T., Hamedinger, T., Sandholzer, D., Hayn, G., Nature Materials, 3, 323-329 (2004). doi:10.1038/nmat117 –Contains results of SIMION simulations.
• GENESIS Solar Wind Concentrator: Computer simulations of performance under solar wind conditions. Wiens R.C., Neugebauer M., Reisenfeld D.B., Moses R.W. Jr., and Nordholt J.E. (2003) Spa. Sci. Rev., 105, 601-626. - The Genesis instrument has now been used to determine the isotopic composition of oxygen and nitrogen in the Sun. Extensively uses SIMION. doi:10.1023/A:1024474028352
• Modeling of an Extraction Lens System for H- Volume Cusp Ion Sources Used to Inject Beam into Commercial Cycltrons Karine Marie Galle Le Du. BS Thesis, Simon Fraser Univerisity, Mar 2003
• Efficiency of Collection of the Secondary Electrons in SEM I. Konvalina and I. Mullerova. Microsc. Microanal. Vol.9 (suppl.3) 108 (2003)
• Usage of Segmental Ionization Detector in Environmental Conditions R. Autrata, J. Jirak, L. Schneider. Microsc. Microanal. Vol 9 (suppl. 3) 142 (2003).
• Measurement of external ion injection and trapping efficiency in the ion trap mass spectrometer and comparison with a predictive model A. Appelhans and D. Dahl. International Journal of Mass Spectrometry. Volume 216, Issue 3, 15 May 2002, pp. 269-284. – A comparison of real quadrupole ion trap injection and trapping efficiencies against SIMION simulations results using SIMION user programs to simulate the hard-sphere collision model for Helium gas.
• Laser ion source development for the Columbia University microbeam A. W. Bigelow,a) G. Randers-Pehrson, and D. J. Brenner. Review of Scientific Instruments. Volume 73, Number 2 February 2002
• GC-AMS Program at NIES-TERRA Y. Shibata et al. Analytical Sciences 2001, Vol. 17 Supplement.
• SIMION for the personal computer in reflection D. A. Dahl, Int. J. Mass Spectrom. 200 (2000) 3-25. (Abstract: origins, history, and capabilities of SIMION (versions 2.0-7.0) from the author’s perspective.)
• Veryovkin I.V., Calaway W.F., Pellin M.J. Three-dimensional modeling of a time-of-flight mass spectrometer: optimisation of SNMS/SIMS transmission using SIMION in “Secondary Ion Mass Spectrometry. SIMS XII, 2000, Elsevier, P.337-340. - this paper D. Dahl cited in his 2000 Int. J. Mass Spectrom. article
• Some practical aspects of the acceleration-deceleration method for ion kinetic energy focusing in matrix-assisted laser desorption/ionization Fourier transform ion cyclotron resonance mass spectrometry R. Pikver, J. Past, J. Subbi, R. Aguraiuja and E. Lippmaa. Eur. J. Mass Spectrom. 6, 289 - 297 (2000)
• Simulation of Ion Trajectories in a Quadrupole Ion Trap: A Comparison of Three Simulation Programs M. W. Forbes, M. Sharifi,T. Croley, Z. Lausevic and R. E. March. J. Mass Spectrom. 34, 12191239 (1999).
• Trajectories of field emitted ions in 3D atom-probe F. Vurpillot - A. Bostel - A. Menand - D. Blavette. Eur. Phys. J. AP 6, 217-221.
• Instrument Simulators Determine Design: Envisioning Ions with SIMION INEEL, 1998. (history, applications, about the author–short, high-level)
• Solution to the ion feedback problem in Hybrid Photon Detectors and Photo Multiplier Tubes D. Ferenc, D. Hrupec, and E. Lorenz. arXiv:physics/9811028 v1 16 Nov 1998.
• Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions S. Daolio, B. Facchin, C. Pagura, A. Tolstogouzov, N. Konenkov. 1998 –”The [quadrupole secondary ion mass spectrometer] was modeled using the SIMION 3D program before building the prototype.”
• New Developments in Hybrid Photon Detectors Daniel Ferenc. Oct 1998.
• D. Dahl. “SIMION 3D Version 6.0”. 43ed ASMS Conference on Mass Spectrometry and Allied Topics, May 21-26 1995, Atlanta, Georgia, pg 717.
• Dahl, D. A.; Delmore, J. E.; Appelhans, A. D. “Simion PC/Ps2 Electrostatic Lens Design Program.” Review of Scientific Instruments, 1990, Vol 61(1) pp 607-609.
• Additional papers listed on the Hemispherical Deflection Analyzer (HDA) (Hemispherical Deflection Analyzer) and Lens pages and in the SIMION 8.0.2/3 examples (README.html files).

See also Links for additional links on SIMION.